BTI Aging Influence Analysis and Mitigation in Flash ADCs
Bias Temperature Instability (BTI)-induced aging of transistors is a serious concern in modern electronic circuits, yet its effects on the operation of mixed-signal circuits have not been extensively studied. In this work, initially we analyze how BTI-induced aging degradation influences the analog...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
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MDPI AG
2025-09-01
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| Edice: | Chips |
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| On-line přístup: | https://www.mdpi.com/2674-0729/4/3/36 |
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