Toward Fast and Scalable Firmware Fuzzing With Dual-Level Peripheral Modeling
Firmware vulnerabilities raise serious security concerns with the rapid growth in connected embedded devices. Fuzzing is an effective dynamic testing technique to find those vulnerabilities; however, firmware fuzzing is very limited by hardware dependence, such as on-chip and off-chip peripherals. T...
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| 主要な著者: | , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
IEEE
2021-01-01
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| シリーズ: | IEEE Access |
| 主題: | |
| オンライン･アクセス: | https://ieeexplore.ieee.org/document/9564029/ |
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