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In situ Raman spectroscopy monitoring of interface aging in aluminum-filled polydimethylsiloxane composites

The increasing power density of chips poses a significant challenge in the form of material aging for aluminum-filled polydimethylsiloxane (Al/PDMS) composites, which are widely used in thermal interface materials. Despite the growing importance of this issue, the specific mechanisms behind the inte...

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Principais autores: Yiming Luo, Yuan Liu, Huiling Feng, Hui Liang, Junda Shen, Yingxue Diao, Yuanchao Liu, Xiaoliang Zeng, Zhenwei Yu, Rong Sun, Binbin Zhou
Formato: Artigo
Idioma:Inglês
Publicado: KeAi Communications Co., Ltd. 2026-04-01
Series:Nano Materials Science
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Acceso en liña:http://www.sciencedirect.com/science/article/pii/S2589965125000558
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