Improved hybrid scrubbing scheme for spaceborne static random access memory-based field programmable gate arrays

With the shrinking feature sizes of static random access memory-based field programmable gate arrays (FPGAs), the occurrence probability of multiple-cell upsets (MCUs) in FPGAs continues to increase. This reduces the reliability of FPGAs. This article proposes an improved hybrid scrubbing scheme to...

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Autors principals:	Yue Li, Zhichun Chen, Yuyao Shen, Yongqing Wang
Format:	Artigo
Idioma:	Inglês
Publicat:	Wiley 2019-07-01
Col·lecció:	The Journal of Engineering
Matèries:	error detection field programmable gate arrays SRAM chips improved hybrid scrubbing scheme spaceborne static random access memory-based field programmable gate arrays shrinking feature sizes multiple-cell upsets conventional hybrid scrubbing scheme error detection process error correction object continuous error detection erroneous zone correction FPGA
Accés en línia:	https://digital-library.theiet.org/content/journals/10.1049/joe.2019.0049
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