Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remain...

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Autors principals:	Adam Sweetman, Sam Jarvis, Rosanna Danza, Philip Moriarty
Format:	Artigo
Idioma:	Inglês
Publicat:	Beilstein-Institut 2012-01-01
Col·lecció:	Beilstein Journal of Nanotechnology
Matèries:	force spectroscopy image contrast noncontact AFM qPlus Si(001) Si(100) tip (apex) structure
Accés en línia:	https://doi.org/10.3762/bjnano.3.3
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