Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source

The Advanced Photon Source (APS) has been upgraded with a multi-bend achromat lattice, achieving significantly reduced electron beam emittance and enhanced X-ray coherence. Precise characterization of these properties is essential for optimizing beamline performance and enabling new experiments that...

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Detalhes bibliográficos

Principais autores:	Xianbo Shi, Yu-Chung Lin, Jiyong Zhao, Thomas Toellner, Michael Y. Hu, Soenke Seifert, Byeongdu Lee, Walan Grizolli, Michael J. Wojcik, Luca Rebuffi, Lahsen Assoufid, Vadim Sajaev
Formato:	Artigo
Idioma:	Inglês
Publicado em:	International Union of Crystallography 2025-09-01
coleção:	Journal of Synchrotron Radiation
Assuntos:	source emittance grating interferometry transverse coherence x-ray optics advanced photon source
Acesso em linha:	https://journals.iucr.org/paper?S160057752500579X
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