Coincidence anomaly detection for unsupervised locating of edge localized modes in the DIII-D tokamak dataset
Using supervised learning to train a machine learning model to predict an on-coming edge localized mode (ELM) requires a large number of labeled samples. Creating an appropriate data set from the very large database of discharges at a long-running tokamak, such as DIII-D, would be a very time-consum...
שמור ב:
| Principais autores: | , , , , |
|---|---|
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
IOP Publishing
2024-01-01
|
| סדרה: | Machine Learning: Science and Technology |
| נושאים: | |
| גישה מקוונת: | https://doi.org/10.1088/2632-2153/ad6be7 |
| תגים: |
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
|
