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Coincidence anomaly detection for unsupervised locating of edge localized modes in the DIII-D tokamak dataset

Using supervised learning to train a machine learning model to predict an on-coming edge localized mode (ELM) requires a large number of labeled samples. Creating an appropriate data set from the very large database of discharges at a long-running tokamak, such as DIII-D, would be a very time-consum...

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Principais autores: Finn H O’Shea, Semin Joung, David R Smith, Daniel Ratner, Ryan Coffee
פורמט: Artigo
שפה:Inglês
יצא לאור: IOP Publishing 2024-01-01
סדרה:Machine Learning: Science and Technology
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גישה מקוונת:https://doi.org/10.1088/2632-2153/ad6be7
תגים: הוספת תג
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