Selective Growth of Homo-Epitaxial Ag-Nano-Layer on Tribo-Assisted-Reorientation
The growth process and orientational degree of incremental-Ag films with a thickness of 5, 50 and 500 nm, respectively, on reoriented Ag (111) surface were studied by in-situ reflection high-energy electron diffraction (RHEED). The orientation of Ag grains for each incremental-Ag-film was also analy...
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| Asıl Yazarlar: | , , |
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| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Japanese Society of Tribologists
2008-04-01
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| Seri Bilgileri: | Tribology Online |
| Konular: | |
| Online Erişim: | https://www.jstage.jst.go.jp/article/trol/3/3/3_3_173/_pdf/-char/en |
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