Back to the Metrics: Exploration of Distance Metrics in Anomaly Detection

With increasing researched focus on industrial anomaly detection, numerous methods have emerged in this domain. Notably, memory bank-based approaches coupled with <i>k</i> distance metrics have demonstrated remarkable performance in anomaly detection (AD) and anomaly segmentation (AS). However, upon...

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Autors principals:	Yujing Lin, Xiaoqiang Li
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2024-08-01
Col·lecció:	Applied Sciences
Matèries:	image anomaly detection defect detection industrial manufacturing distance metrics anomaly score distribution
Accés en línia:	https://www.mdpi.com/2076-3417/14/16/7016
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