Measurement of Submicron Particle Size Using Scattering Angle-Corrected Polarization Difference with High Angular Resolution

The particle size of submicron particles significantly affects their properties; thus, the accurate measurement of submicron particle size is essential to ensure its excellent properties. Polarized light scattering is an important tool for measuring the particle size of the ensemble of particles in...

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Bibliografische gegevens

Hoofdauteurs:	Chaoyi Shi, Zuwei Zhu, Gaofang Yin, Xianhe Gao, Zhongma Wang, Sheng Zhang, Zehua Zhou, Xueyou Hu
Formaat:	Artigo
Taal:	Inglês
Gepubliceerd in:	MDPI AG 2023-11-01
Reeks:	Photonics
Onderwerpen:	submicron particle size polarized light scattering polarization difference high angular resolution wide scattering angle range scattering angle correction
Online toegang:	https://www.mdpi.com/2304-6732/10/11/1282
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