Exploring Feature Selection Scenarios for Deep Learning-based Side-channel Analysis
One of the main promoted advantages of deep learning in profiling sidechannel analysis is the possibility of skipping the feature engineering process. Despite that, most recent publications consider feature selection as the attacked interval from the side-channel measurements is pre-selected. This...
שמור ב:
| Principais autores: | , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Ruhr-Universität Bochum
2022-08-01
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| סדרה: | Transactions on Cryptographic Hardware and Embedded Systems |
| נושאים: | |
| גישה מקוונת: | https://tches.iacr.org/index.php/TCHES/article/view/9842 |
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