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Real-Time Temperature Prediction of Power Devices Using an Improved Thermal Equivalent Circuit Model and Application in Power Electronics

As a core component of photovoltaic power generation systems, insulated gate bipolar transistor (IGBT) modules continually suffer from severe temperature swings due to complex operation conditions and various environmental conditions, resulting in fatigue failure. The junction temperature prediction...

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Principais autores: Zhen Hu, Man Cui, Xiaohua Wu
פורמט: Artigo
שפה:Inglês
יצא לאור: MDPI AG 2023-12-01
סדרה:Micromachines
נושאים:
temperature prediction
power device
thermal model
reliability
גישה מקוונת:https://www.mdpi.com/2072-666X/15/1/63
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