Research on IGBT aging prediction method based on adaptive VMD decomposition and GRU-AT model

The insulated gate bipolar transistor (IGBT) is widely used in the power electronic system, but its aging state is difficult to predict in advance due to the complicated failure mechanism, which will affect the performance of the equipment, and even cause serious disaster. Therefore, we propose a co...

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Bibliografiska uppgifter

Huvudupphov:	Biyun Chen, Dongting Xie, Riwang Huang, YongJun Zhang, Jingmin Chi, Xiaoxuan Guo, Qinhao Li
Materialtyp:	Artigo
Språk:	Inglês
Utgiven:	Elsevier 2023-09-01
Serie:	Energy Reports
Ämnen:	Insulated gate bipolar transistors Aging state of IGBT Adaptive VMD decomposition Improved sparrow search algorithm Gated recurrent unit
Länkar:	http://www.sciencedirect.com/science/article/pii/S2352484723006042
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