Radiation Hardness of Flash Memory Fabricated in Deep-Submicron Technology
This paper discusses the current problem of the electronic memory reliability in terms of the ionizing radiation effects. The topic is actual since the high degree of components' miniaturization integrated into the flash memory causes the extreme sensitivity of this memory type to the ionizing radia...
-д хадгалсан:
| Үндсэн зохиолчид: | , , , , |
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| Формат: | Artigo |
| Хэл сонгох: | Inglês |
| Хэвлэсэн: |
Wiley
2013-01-01
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| Цуврал: | International Journal of Photoenergy |
| Онлайн хандалт: | http://dx.doi.org/10.1155/2013/158792 |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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