Abnormal Output Characteristics of p-Type Low Temperature Polycrystalline Silicon Thin Film Transistor Fabricated on Polyimide Substrate

We report on an abnormal output characteristics in p-type low temperature polycrystalline silicon thin-film transistors fabricated on polyimide (PI); negative differential conductance behavior is often observed in saturation region of drain current from large width devices. To understand such abnorm...

Täydet tiedot

Bibliografiset tiedot

Päätekijät:	Seok-Woo Lee, Chang Bum Park, Pyo Jin Jeon, Sung-Wook Min, June Yeong Lim, Han Sol Lee, Jae-Sung Yoo, Soon Sung Yoo, Seongil Im
Aineistotyyppi:	Artigo
Kieli:	Inglês
Julkaistu:	IEEE 2016-01-01
Sarja:	IEEE Journal of the Electron Devices Society
Aiheet:	Thin-film transistor (TFT), LTPS self-heating effect hot carrier effect polyimide (PI) flexible
Linkit:	https://ieeexplore.ieee.org/document/7302517/
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