Graphene-based quantum Hall arrays in cross–square recursion configurations

In electrical metrology, the quantum Hall effect is accessed at the Landau level filling factor ν = 2 plateau to define and disseminate the unit of electrical resistance (ohm). The robustness of the plateau is only exhibited at this Landau level filling factor and thus places a constraint on the qua...

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Bibliografiske detaljer

Principais autores:	N. T. M. Tran, M. Musso, D. S. Scaletta, W.-C. Lin, V. Ortiz Jimenez, D. G. Jarrett, M. Ortolano, C. A. Richter, C.-T. Liang, D. B. Newell, A. F. Rigosi
Format:	Artigo
Sprog:	Inglês
Udgivet:	AIP Publishing LLC 2025-08-01
Serier:	AIP Advances
Online adgang:	http://dx.doi.org/10.1063/5.0290385
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