Modeling the Impact of Fabrication Variabilities on the Performance of Silicon Avalanche Photodetectors
This work presents a systematic study of the sensitivities of silicon avalanche photodiode (APD) performance metrics, including gain, excess noise, and bandwidth, to potential variabilities in the fabrication process. The APDs simulations are performed using a state-of-the-art Full-Band Monte Carlo...
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| Hauptverfasser: | , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
IEEE
2024-01-01
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| Schriftenreihe: | IEEE Photonics Journal |
| Schlagworte: | |
| Online-Zugang: | https://ieeexplore.ieee.org/document/10508076/ |
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