Study of the Influence of the Voltage Regulator Integrated Circuit Topology on its Radiation Hardness
Method of recording responses to radiation exposure is considered using the X-ray complex RIK-0401 and it is shown that for linear voltage regulators integrated circuits it allows diagnosing presence of changes in their topology. Four types of integrated circuits (ICs) of IS-LS1-1.8V type have been...
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| Autors principals: | , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Belarusian National Technical University
2025-03-01
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| Col·lecció: | Приборы и методы измерений |
| Matèries: | |
| Accés en línia: | https://pimi.bntu.by/jour/article/view/929 |
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