क्यूआर कोड

Refractometric Sensing Using High-Order Diffraction Spots From Ordered Vertical Silicon Nanowire Arrays

We propose to use high-order diffraction spots from 2-D silicon nanowire (NW) arrays for refractive index sensing based on spatial changes in the diffractive spots position. The NW arrays act both as a refractive index sensor and as dispersive elements, eliminating the need for external spectrometer...

पूर्ण विवरण

में बचाया:
मुख्य लेखकों: Iman Khodadad, Navneet Dhindsa, Simarjeet S. Saini
स्वरूप: Artigo
भाषा:Inglês
प्रकाशित: IEEE 2016-01-01
श्रृंखला:IEEE Photonics Journal
विषय:
Silicon nanowires
refractive index sensors
diffraction
spectral analysis
ऑनलाइन पहुंच:https://ieeexplore.ieee.org/document/7444133/
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