First Evidence of Temporary Read Errors in TLC 3D-NAND Flash Memories Exiting From an Idle State
This paper presents a new reliability threat that affects 3D-NAND Flash memories when a read operation is performed exiting from an idle state. In particular, a temporary large increase of the fail bits count is reported for the layers read as first after a sequence of program/verify and a idle rete...
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| Glavni autori: | , , , |
|---|---|
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
IEEE
2020-01-01
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| Serija: | IEEE Journal of the Electron Devices Society |
| Teme: | |
| Online pristup: | https://ieeexplore.ieee.org/document/8956089/ |
| Oznake: |
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