Fourier imaging for nanophotonics
Standard optical characterization and spectroscopy techniques rely on the measurement of specular reflection, transmission, or emission at normal incidence. Although the usefulness of these methods is without question, they do not provide information on the angular dependence of the scattered light...
Guardado en:
| Autores principales: | , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Wiley
2024-02-01
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| Colección: | Nanophotonics |
| Materias: | |
| Acceso en línea: | https://doi.org/10.1515/nanoph-2023-0887 |
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