Enhanced Near-Surface Flaw Detection in Additively Manufactured Metal Ti-5Al-5V-5Mo-3Cr Using the Total Focusing Method

Additive manufacturing (AM) enables the fabrication of complex components with high geometric freedom, but it can introduce near-surface flaws due to rapid solidification, resulting in porosity and lack of fusion. In addition, localized melting and steep thermal gradients favor the formation of micr...

Täydet tiedot

Bibliografiset tiedot

Päätekijät:	Kate van Herpt, Mohammad E. Bajgholi, P. Ross Underhill, Catalin Mandache, Thomas W. Krause
Aineistotyyppi:	Artigo
Kieli:	Inglês
Julkaistu:	MDPI AG 2025-10-01
Sarja:	Sensors
Aiheet:	non-destructive testing (NDT) total focusing method (TFM) phased array ultrasonic testing (PAUT) additive manufacturing (AM) near-surface flaw detection
Linkit:	https://www.mdpi.com/1424-8220/25/20/6425
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