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Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test

At present, accelerated degradation test research is carried out mostly for single stress condition, while the products are faced with an operating condition of many environmental stresses in the field. This paper presented a data modeling method and analysis process for accelerated degradation test...

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Uloženo v:
Hlavní autoři: YIN Chao, ZHOU Guifa, WANG Xu, DU Shaohua
Médium: Artigo
Jazyk:Chinês
Vydáno: Editorial Office of Control and Information Technology 2018-01-01
Edice:Kongzhi Yu Xinxi Jishu
Témata:
accelerated degradation test
multi-stress condition
degradation model
stability test
circuit board
On-line přístup:http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2096-5427.2018.05.015
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