High magnification optical imaging systems for the characterization of soft X-ray focii

We present a series of novel X-ray imaging systems designed specifically for the soft X-ray energy range, optimized for operation in ultra-high-vacuum environments and compactness. These systems achieve micrometre-level spatial resolution with high collection efficiency of visible light by using hig...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Andre Al Haddad, Antoine Sarracini, Kirsten Schnorr, Gregor Knopp, Juraj Krempasky, Christopher Arrell, Sven Augustin, Loïc Bassement, Katherine Brupbacher, Joan Vila-Comamala, Christian David, Uwe Flechsig, Rolf Follath, Zhaoheng Guo, Markus Herzog, Jonas Knurr, Csaba Lombosi, Eloisa Manetti, Suddhasattwa Mandal, Ana Sofia Morillo-Candas, Peng Qi, Boris V. Sorokin, Scott Stubbs, Zhibin Sun, Simon Christian Tiefenbacher, Jakub Vonka, Ulrich Hilmar Wagner, Xinhua Xie, Ningchen Yang, Hankai Zhang, Christoph Bostedt
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	International Union of Crystallography 2025-11-01
Цуврал:	Journal of Synchrotron Radiation
Нөхцлүүд:	soft x-rays imaging focus characterization micrometric resolution talbot imaging
Онлайн хандалт:	https://journals.iucr.org/paper?S160057752500774X
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!