DF‐FPM: Low Complexity Fourier Ptychographic Microscopy via Selective Dark Field Updating

Fourier ptychographic microscopy (FPM) attracts growing interest for its capacity to achieve high resolution, large field‐of‐view quantitative phase imaging. However, noise contamination in abundant dark field images restricts further improvements in reconstruction quality and computational efficien...

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Detalhes bibliográficos

Principais autores:	Qingxin Wang, Yanqi Chen, Aiye Wang, An Pan, Yishi Shi
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Wiley-VCH 2026-04-01
coleção:	Advanced Photonics Research
Assuntos:	Fourier ptychographic microscopy (FPM) Plug‐and‐Play (PnP) selective dark field updating
Acesso em linha:	https://doi.org/10.1002/adpr.202500289
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