Binary Amplitude Reflection Gratings for X-ray Shearing and Hartmann Wavefront Sensors
New, high-coherent-flux X-ray beamlines at synchrotron and free-electron laser light sources rely on wavefront sensors to achieve and maintain optimal alignment under dynamic operating conditions. This includes feedback to adaptive X-ray optics. We describe the design and modeling of a new class of...
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| Autores principales: | , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
MDPI AG
2021-01-01
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| Colección: | Sensors |
| Materias: | |
| Acceso en línea: | https://www.mdpi.com/1424-8220/21/2/536 |
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