Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nano...

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Detalhes bibliográficos

Principais autores:	Yue Niu, Sergio Gonzalez-Abad, Riccardo Frisenda, Philipp Marauhn, Matthias Drüppel, Patricia Gant, Robert Schmidt, Najme S. Taghavi, David Barcons, Aday J. Molina-Mendoza, Steffen Michaelis de Vasconcellos, Rudolf Bratschitsch, David Perez De Lara, Michael Rohlfing, Andres Castellanos-Gomez
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2018-09-01
Colecção:	Nanomaterials
Assuntos:	2D materials transition metal dichalcogenides (TMDCs) MoS2 MoSe2 WS2 WSe2 optical properties differential reflectance
Acesso em linha:	http://www.mdpi.com/2079-4991/8/9/725
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