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Reliability Evaluation and Failure Simulation Research of the PIN Limiter in Complex Electromagnetic Environments

As the electromagnetic environment becomes increasingly complex, high-power microwave (HPM) pulses with different parameters are superimposed and coupled into RF receivers. Consequently, the PIN limiter at the front end often fails due to excessive input power. To accurately solve the real-time dist...

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Bibliografiske detaljer
Principais autores: Lan Li, Yang Zhang, Lishan Zhao, Xingjun Ge, Yuwei Fan
Format: Artigo
Sprog:Inglês
Udgivet: IEEE 2026-01-01
Serier:IEEE Access
Fag:
Online adgang:https://ieeexplore.ieee.org/document/11488726/
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