Adaptive Drive as a Control Strategy for Fast Scanning in Dynamic Mode Atomic Force Microscopy
Atomic Force Microscopy (AFM) is an advanced imaging technique which features nanoscale resolution and the ability to work under physiological conditions on soft samples. Modern AFM systems offer easy access to Dynamic Mode imaging which reduces the tip–sample interaction and increases the effective...
Tallennettuna:
| Päätekijät: | , , , , |
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| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
MDPI AG
2025-01-01
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| Sarja: | Sensors |
| Aiheet: | |
| Linkit: | https://www.mdpi.com/1424-8220/25/3/860 |
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