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Unexpected Phonon Behaviour in BiFe<sub>x</sub>Cr<sub>1−x</sub>O<sub>3</sub>, a Material System Different from Its BiFeO<sub>3</sub> and BiCrO<sub>3</sub> Parents

The dielectric function and the bandgap of BiFe<sub>0.5</sub>Cr<sub>0.5</sub>O<sub>3</sub> thin films were determined from spectroscopic ellipsometry and compared with that of the parent compounds BiFeO<sub>3</sub> and BiCrO<sub>3</sub>. The bandgap value of BiFe<sub>0.5</sub>Cr<sub>0.5</sub>O<sub>3...

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Principais autores: Cameliu Himcinschi, Felix Drechsler, David Sebastian Walch, Akash Bhatnagar, Alexei A. Belik, Jens Kortus
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI AG 2022-05-01
coleção:Nanomaterials
Assuntos:
Raman spectroscopy
thin films
spectroscopic ellipsometry
charge transfer
phase transition
multiferroics
Acesso em linha:https://www.mdpi.com/2079-4991/12/9/1607
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