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Transistor Open-Circuit Fault Diagnosis for Three-Phase DAB Converters Using a Reduced Number of Sensors

This work presents a diagnosis strategy of transistor open-circuit faults for three-phase dual-active bridge DC-DC converters. The diagnostic approach evaluates the DC components of the phase currents established due to a fault condition. In addition, as these symptoms are reflected in the DC-side c...

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Hlavní autoři: Jonathan Emmanuel Ochoa Sosa, Ruben Orlando Nunez, G. Elias Oggier, Facundo Aguilera, German G. Oggier, Obaid Aldosari
Médium: Artigo
Jazyk:Inglês
Vydáno: IEEE 2025-01-01
Edice:IEEE Open Journal of Power Electronics
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On-line přístup:https://ieeexplore.ieee.org/document/11130376/
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