Wideband dielectric properties of silicon and glass substrates for terahertz integrated circuits and microsystems

This paper presents a comprehensive study of the optical and electrical dielectric material properties of six commonly-used silicon and glass substrates at terahertz (THz) frequencies, including refractive index, absorption coefficient, dielectric constant and loss factor. The material characterizat...

Täydet tiedot

Bibliografiset tiedot

Päätekijät:	Nonchanutt Chudpooti, Nattapong Duangrit, Andrew D Burnett, Joshua R Freeman, Thomas B Gill, Chuwong Phongcharoenpanich, Ulrik Imberg, Danai Torrungrueng, Prayoot Akkaraekthalin, Ian D Robertson, Nutapong Somjit
Aineistotyyppi:	Artigo
Kieli:	Inglês
Julkaistu:	IOP Publishing 2021-01-01
Sarja:	Materials Research Express
Aiheet:	THz time-domain spectroscopy material characterization dielectric properties electrical properties
Linkit:	https://doi.org/10.1088/2053-1591/abf684
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