Cumulative Sum Control Chart for a Doubly Truncated Binomial Distribution
The CUSUM control chart for a doubly truncated binomial distribution (DTBD) is developed by using the well known approach of Johnson and the parameters of the V-mask are computed. The average run length for the one sided CUSUM scheme for testing the proportion of defectives underlying the DTBD is al...
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| Principais autores: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Cairo University, Faculty of Graduate Studies for Statistical Research (FGSSR)
1991-06-01
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| coleção: | The Egyptian Statistical Journal |
| Assuntos: | |
| Acesso em linha: | https://esju.journals.ekb.eg/article_315000_e65bcad91e936e450d13017b92ce9da3.pdf |
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