Automated Orientation and Diffraction Intensity (AODI) Mapping on a Curved Surface
A method for automated orientation and diffraction intensity (AODI) mapping on a curved surface has been established at the Shanghai Synchrotron Radiation Facility (SSRF). In our method, the curved surface of the sample is measured as the three-dimensional positional changes in the sample stage duri...
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| Glavni autori: | , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
MDPI AG
2025-02-01
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| Serija: | Crystals |
| Teme: | |
| Online pristup: | https://www.mdpi.com/2073-4352/15/3/200 |
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