A convolutional neural network approach for multilayer analysis in infrared nanospectroscopy
The combination of Fourier-transform infrared spectroscopy and scattering-type scanning near-field optical microscopy allows for the spectroscopic investigation of materials and structures at the nanoscale, far below the diffraction limit in the infrared. This resolution is achieved by the use of me...
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| Hoofdauteurs: | , |
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| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
EDP Sciences
2024-01-01
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| Reeks: | EPJ Web of Conferences |
| Online toegang: | https://www.epj-conferences.org/articles/epjconf/pdf/2024/19/epjconf_eosam2024_05002.pdf |
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