Characterization and genetic dissection of the powdery mildew resistance in cultivated emmer wheat accession L424

Abstract Background Powdery mildew, caused by the fungal pathogen Blumeria graminis f. sp. tritici (Bgt), is a widespread disease affecting wheat globally, exerting significant adverse impacts on both wheat yield and quality. The utilization of powdery mildew resistance genes represents the most eff...

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Hlavní autoři:	Dongming Li, Yaoxue Li, Ningning Yu, Lige Geng, Yanmin Qie, Hongxing Xu, Bo Wang, Jun Guo, Jiatong Li, Nina Sun, Linzhi Li, Guantong Pan, Yintao Dai, Yuli Jin, Pengtao Ma
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	BMC 2025-11-01
Edice:	BMC Plant Biology
Témata:	Cultivated emmer wheat Powdery mildew Gene mapping Molecular marker-assisted selection
On-line přístup:	https://doi.org/10.1186/s12870-025-07800-3
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