Optimization of Electrochemical Etching Parameters in FIM/STM Tungsten Nanotip Fabrication
Field Ion Microscopy (FIM) and Scanning Tunneling Microscopy (STM) have found a wide application in nanotechnology. These microscopes use a metallic nanotip for image acquisition. Resolution of FIM and STM images depends largely on the radius of nanotip apex; the smaller the radius the higher the re...
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| Médium: | Artigo |
| Jazyk: | Inglês |
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University of Tehran
2010-03-01
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| Edice: | Journal of Sciences, Islamic Republic of Iran |
| Témata: | |
| On-line přístup: | https://jsciences.ut.ac.ir/article_20141_bb6da2e52c13cd3159c895c345da5722.pdf |
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