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TXM-Pal: a companion software for advanced data processing in spectroscopic X-ray microscopy

Transmission X-ray microscopy (TXM) is a powerful and non-destructive tool for interpreting the chemical states of a wide range of materials. It utilizes X-ray absorption near-edge structure (XANES) for the chemically sensitive mapping of specific elements, making it particularly effective for study...

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Detaylı Bibliyografya
Asıl Yazarlar: Sugeun Jo, Sangwoo Kim, Jun Lim
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: International Union of Crystallography 2025-05-01
Seri Bilgileri:Journal of Synchrotron Radiation
Konular:
Online Erişim:https://journals.iucr.org/paper?S1600577525002036
Etiketler: Etiketle
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