Detection of plant-derived silica particle contamination in wheat flour: A first step toward understanding possible dietary exposure
Plant-derived silica structures (phytoliths) occur naturally in cereals such as wheat, but their role as unintended dietary contaminants has been underexplored. Using field emission scanning electron microscopy with energy-dispersive X-ray spectroscopy (FESEM-EDX), we systematically detected and qua...
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| Asıl Yazarlar: | , , , , , , , , , |
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| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Elsevier
2025-12-01
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| Seri Bilgileri: | Journal of Agriculture and Food Research |
| Konular: | |
| Online Erişim: | http://www.sciencedirect.com/science/article/pii/S266615432500821X |
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