Convenient Real-Time Monitoring of the Contamination of Surface Ion Trap
Recent studies indicated that contamination by adatoms on the surface ion trap can generate contact potential, leading to fluctuations in patch potential. By investigating contamination induced by surface adatoms during a loading process, a direct physical image of the contamination process and the...
में बचाया:
| मुख्य लेखकों: | , , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
MDPI AG
2020-01-01
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| श्रृंखला: | Nanomaterials |
| विषय: | |
| ऑनलाइन पहुंच: | https://www.mdpi.com/2079-4991/10/1/109 |
| टैग: |
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