Analysis of support vector machine and random forest models for classification of the impact of technostress in covid and post-covid era

This study addresses the growing concern of technostress, a condition caused by the overwhelming use of digital technologies, exacerbated by the COVID-19 pandemic. The researchers developed a predictive model using machine learning algorithms, Random Forest (RF) and Support Vector Machine (SVM), to...

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Autores principales:	Gabriel James, Ime Jonah Umoren, Saviour Inyang, Oscar Aloysius
Formato:	Artigo
Lenguaje:	Inglês
Publicado:	Nigerian Society of Physical Sciences 2024-07-01
Colección:	Journal of Nigerian Society of Physical Sciences
Materias:	COVID-19 era Technostress Machine Learning Models Deep Learning
Acceso en línea:	https://journal.nsps.org.ng/index.php/jnsps/article/view/2102
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