Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory
To satisfy the increasing demands for more word-line (WL) layers, the dual-deck even triple-deck architecture has emerged in 3D NAND Flash. However, the new reliability issues that occurred at the joint region of two decks became a severe challenge for developing multiple-deck technology. This work...
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| Hauptverfasser: | , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
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MDPI AG
2023-10-01
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| Schriftenreihe: | Micromachines |
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| Online-Zugang: | https://www.mdpi.com/2072-666X/14/10/1916 |
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