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AI-Based Models for Distance and Region Estimation of High Impedance Faults Under Variate Scenarios

High-impedance faults (HIFs) occur when an energized distribution system (DS) conductor comes into contact with a high-impedance surface. Their erratic behavior and low fault current make them difficult to detect with conventional protection schemes, and HIF location, in particular, remains a scarce...

Ausführliche Beschreibung

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Bibliografische Detailangaben
Hauptverfasser: Gabriela N. Lopes, Mauricio P. Silva, Jose Carlos de Melo Vieira
Format: Artigo
Sprache:Inglês
Veröffentlicht: IEEE 2026-01-01
Schriftenreihe:IEEE Open Access Journal of Power and Energy
Schlagworte:
Online-Zugang:https://ieeexplore.ieee.org/document/11510321/
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