Quantifying wheat spike morphology by high resolution 3D surface scanning
Abstract An understanding of spike shape will be of great benefit for improving wheat yields. Traditional manual measurements of spike traits are slow and prone to human error, preventing large-scale phenotyping. Employing imaging techniques will allow researchers to measure multiple morphometric pa...
שמור ב:
| Principais autores: | , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
BMC
2026-06-01
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| סדרה: | Plant Methods |
| נושאים: | |
| גישה מקוונת: | https://doi.org/10.1186/s13007-026-01550-5 |
| תגים: |
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