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Thickness Dependence of Structural and Optical Properties of CdTe Films

In this work, Cadmium Telluride (CdTe) thin films were deposited on glass substrates at room temperature by vacuum evaporation technique. The deposited CdTe thin films were characterized by X-ray diffraction, UV-Visible spectroscopy and Field emission scanning electron microscope (FESEM) techniques....

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Bibliografiset tiedot
Päätekijät: R. Zarei Moghadam, M.H. Ehsani, H. Rezagholipour Dizaji, M.R. Sazideh
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Iran University of Science & Technology 2018-09-01
Sarja:Iranian Journal of Materials Science and Engineering
Aiheet:
Linkit:http://ijmse.iust.ac.ir/browse.php?a_code=A-10-1630-1&slc_lang=en&sid=1
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