QR Code

Transient analysis of high-Z impurity screening by additional injection of low-Z impurity using integrated divertor code SONIC

The dynamics of the screening effect of Ar impurity by the injection of additional Ne has been studied through time-dependent analysis with the integrated divertor code SONIC. In the preceding study (Yamoto et al 2020 Plasma Phys. Control. Fusion   62 045006), the predictive simulation of JT-60SA pl...

Description complète

Enregistré dans:
Détails bibliographiques
Auteurs principaux: Shohei Yamoto, Kazuo Hoshino, Yuki Homma, Tomohide Nakano, Nobuhiko Hayashi
Format: Artigo
Langue:Inglês
Publié: IOP Publishing 2023-01-01
Collection:Nuclear Fusion
Sujets:
Accès en ligne:https://doi.org/10.1088/1741-4326/acd12c
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!