Quick Fabrication VCSELs for Characterisation of Epitaxial Material
A systematic analysis of the performance of VCSELs, fabricated with a decreasing number of structural elements, is used to assess the complexity of fabrication (and therefore time) required to obtain sufficient information on epitaxial wafer suitability. Initially, sub-mA threshold current VCSEL dev...
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| Principais autores: | , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
MDPI AG
2021-10-01
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| Series: | Applied Sciences |
| Assuntos: | |
| Acceso en liña: | https://www.mdpi.com/2076-3417/11/20/9369 |
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