X-ray reflectivity from curved surfaces as illustrated by a graphene layer on molten copper
The X-ray reflectivity technique can provide out-of-plane electron-density profiles of surfaces, interfaces, and thin films, with atomic resolution accuracy. While current methodologies require high surface flatness, this becomes challenging for naturally curved surfaces, particularly for liquid met...
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| Principais autores: | , , , , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2022-05-01
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| coleção: | Journal of Synchrotron Radiation |
| Assuntos: | |
| Acesso em linha: | http://scripts.iucr.org/cgi-bin/paper?S1600577522002053 |
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