Non‐destructive thickness measurement of optically scattering polymer films using image processing
Abstract We establish a sample‐ and data‐processing pipeline that allows for high‐throughput optical microscope measurement of porous films, provided they are sufficiently optically scattering. Here, self‐limiting electrospray deposition (SLED) is used to manufacture scattering films of different mo...
Gorde:
| Egile Nagusiak: | , , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Wiley
2024-09-01
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| Saila: | Engineering Reports |
| Gaiak: | |
| Sarrera elektronikoa: | https://doi.org/10.1002/eng2.12830 |
| Etiketak: |
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