Effect of laser fluence on structural and optical properties of CuxS films grown by pulsed laser deposition at different wavelengths

Cu _x S thin films were grown onto soda-lime glass substrates by pulsed laser deposition at two different wavelengths: 1064 and 532 nm. X-ray diffraction, Raman and UV–vis spectroscopies were used to characterize the Cu _x S films. Results are presented as a function of laser fluence. XRD patterns i...

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Bibliografische gegevens

Hoofdauteurs:	P E Rodríguez-Hernández, J G Quiñones-Galván, M Meléndez-Lira, J Santos-Cruz, G Contreras-Puente, F de Moure-Flores
Formaat:	Artigo
Taal:	Inglês
Gepubliceerd in:	IOP Publishing 2020-01-01
Reeks:	Materials Research Express
Onderwerpen:	CuxS thin films pulsed laser deposition laser fluence different wavelengths
Online toegang:	https://doi.org/10.1088/2053-1591/ab663d
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